Seiken Micro Technology Co.,Ltd.
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  • About us
  • Spring Probe
    • Alloy Probe
    • High Frequency Probe
    • Fine Pitch Probe
    • Special Needs Probe
    • Probe For Customer Design
  • Probe Card
    • Pogo Pin Probe Card
    • Kelvin Probe Card
    • TCP/COF Vertical Type Probe Card
    • Micro Cube Probe Card
  • Test Socket
    • High Frequncy Test Socket
    • TCP/COF TEST SOCKET
    • IC TEST SOCKET
  • FPD Test
    • Flat Panel Display Lighting Test
  • Machine
    • PCB/Substrate Test System
    • MCM Substrate Test System
    • Desk Type Manual Test Fixture
  • Fixture
    • Probe Pin Tower
    • MCM IC Substrate O/S Test Probe Card
    • TAB/COF/TBGA O/S Test Probe Card
  • Semiconductor manufacturer
    • Semiconductor Producers
    • Semiconductor Maker
    • Semiconductor Wholesale
    • Semiconductor Production
    • Test Socket Manufacturer
    • Test Socket Wholesale
    • Test Socket Production
    • Probe Card Manufacturer
    • Probe Card Wholesale
    • Probe Card Production
    • Probe Tower Manufacturer
    • Probe Tower Wholesale
    • Probe Tower Production
    • Substrate Test System Manufacturer
    • Substrate Test System Wholesale
    • Substrate Test System Production
  • Contact us
  • 精研微科技
  1. Home
  2. Products
  3. Application
  4. High Density Printed Circuit Test

Products

  • Spring Probe
    • Alloy Probe
      • Alloy Probe
    • High Frequency Probe
      • High Frequency Probe
    • Fine Pitch Probe
      • Fine Pitch Probe
    • Special Needs Probe
      • Special Needs Probe
    • Probe For Customer Design
      • Probe for Customer Design
  • Probe Card
    • Pogo Pin Probe Card
      • Pogo Pin Probe Card
    • Kelvin Probe Card
      • kelvin Probe Card
    • TCP/COF Vertical Type Probe Card
      • TCP/COF Vertical Type Probe Cards
    • Micro Cube Probe Card
      • Micro Cube Probe Card
  • Test Socket
    • High Frequncy Test Socket
      • High Frequncy Test Socket
    • TCP/COF TEST SOCKET
      • TCP/COF Test Socket
    • IC TEST SOCKET
      • IC Test Socket
  • FPD Test
    • Flat Panel Display Lighting Test
      • Flat Panel Display Lighting Test
  • Machine
    • PCB/Substrate Test System
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
    • MCM Substrate Test System
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
    • Desk Type Manual Test Fixture
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
  • Fixture
    • Probe Pin Tower
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
    • MCM IC Substrate O/S Test Probe Card
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
    • TAB/COF/TBGA O/S Test Probe Card
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
  • Application
    • Semiconductor Test
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Flat Panel Display Cell Test
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • High Density Printed Circuit Test
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Test Pin Solution
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Electronics Components
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Customized Solution
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe

High Density Printed Circuit Test

View:
IC Test Socket

IC Test Socket

For lead-free solder balls, the use of original advanced coating technology and alloys prevents solder adhesion for reliable testing. Moreover, it is possible to perform not only single point contact but also Kelvin contact.
More
Flat Panel Display Lighting Test

Flat Panel Display Lighting Test

As the resolution of LCD and OLED increases, the pitch of Pad becomes smaller and smaller, and the refined Micro Cube ensures stable lighting test. The unique contact pin and ultra-fine processing technology ensure that it can be applied to "staggered 25um". "And" the tiny pitch of 40um".
More
Pogo Pin Probe Card

Pogo Pin Probe Card

In the WLCSP and FLIPCHIP tests, the contact technology of solder balls accumulated by Test Socket for many years was applied to the production of probe cards. Reliable testing is achieved by using the unique advanced plating technology and alloy materials to prevent solder adhesion.
More
High Frequency Probe

High Frequency Probe

In order to ensure the reliability of various semiconductor RF components, high-frequency probes are indispensable.
1. For the purpose of high frequency testing, the full length is shortened to an ultimate length of 1.5 mm.
  2. Depending on the type of component electrode, different needle types such as crown head and pointed head can be provided.
  3. As with the general spring probe, you can replace any of the probes separately.
More
PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture

PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture

From small desktop panels to floor-mounted small and medium-sized panel testers, we can produce a wide range of products according to customer needs.

In addition, in addition to the panel machine, we can also contact us regarding the test machine for the substrate and components.
More
Special Needs Probe

Special Needs Probe

For the inspection of various magnetic sensors such as electronic compass, Hall IC, MR, and MI Sensor, it is sought to use a non-magnetic probe inspection.
More
kelvin Probe Card

kelvin Probe Card

With the Kelvin probe card of the traditional probe, the needle spacing of Force and Sense cannot be shortened, causing the tip of the needle to slip on the solder ball, and the tip of the needle is not in the center of the Pad, so stable contact cannot be obtained.
More
TCP/COF Vertical Type Probe Cards

TCP/COF Vertical Type Probe Cards

Compared with the current TCP and COF inspection probe cards, it is easier to respond to Multi DUT products, and each needle can be replaced individually to reduce operating costs.
More
High Frequncy Test Socket

High Frequncy Test Socket

經由改變針頭形狀和表面處理,使得探針在LGA、BGA等封裝方式測試方面,有穩定信號傳輸及沒有限制探針配置的優點。
More
TCP/COF Test Socket

TCP/COF Test Socket

採用具有獨創構造的Tubeless探針,適用於150um窄小間距。Tubeless探針採用無套筒彈簧的獨創構造,可適用於高密度的測試頭。另外,經由採用獨創的彈簧,不僅可適用於小間距,同時可實現100萬次的耐用壽命。
More
POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture

POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture

A full range of probe series, the accumulated know-how of fixture manufacturing for many years, the product can meet the testing requirements of various electronic components. Therefore, any business that needs to use a probe for contact testing can contact us.
More
Probe for Customer Design

Probe for Customer Design

A variety of probes can be customized to meet customer needs.
No matter the length, the shape of the needle, the material of the material, the type of plating, the high frequency demand, the high temperature demand, the high current demand, etc., etc., if there are other needs, a review is also welcome.
More
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Seiken Micro Technology Co.,Ltd.

9F.-7, No. 888, Jingguo Rd., Taoyuan Dist., Taoyuan City 330, Taiwan (R.O.C.)

TEL:+886 3-346-6062

FAX:+886 3-346-6052

Email:info@seiken.com.tw

Fixture
  • Probe Pin Tower
    • MCM IC Substrate O/S Test Probe Card
      • TAB/COF/TBGA O/S Test Probe Card
        Probe Card
        • Pogo Pin Probe Card
          • Kelvin Probe Card
            • TCP/COF Vertical Type Probe Card
              • Micro Cube Probe Card
                Test Socket
                • High Frequncy Test Socket
                  • TCP/COF TEST SOCKET
                    • IC TEST SOCKET
                      FPD Test
                      • Flat Panel Display Lighting Test
                        Machine
                        • PCB/Substrate Test System
                          • MCM Substrate Test System
                            • Desk Type Manual Test Fixture
                              Semiconductor manufacturer
                              • Semiconductor Producers
                                • Semiconductor Maker
                                  • Semiconductor Wholesale
                                    • Semiconductor Production
                                      • Test Socket Manufacturer
                                        • Test Socket Wholesale
                                          • Test Socket Production
                                            • Probe Card Manufacturer
                                              • Probe Card Wholesale
                                                • Probe Card Production
                                                  • Probe Tower Manufacturer
                                                    • Probe Tower Wholesale
                                                      • Probe Tower Production
                                                        • Substrate Test System Manufacturer
                                                          • Substrate Test System Wholesale
                                                            • Substrate Test System Production
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