For lead-free solder balls, the use of original advanced coating technology and alloys prevents solder adhesion for reliable testing. Moreover, it is possible to perform not only single point contact but also Kelvin contact.
As the resolution of LCD and OLED increases, the pitch of Pad becomes smaller and smaller, and the refined Micro Cube ensures stable lighting test. The unique contact pin and ultra-fine processing technology ensure that it can be applied to "staggered 25um". "And" the tiny pitch of 40um".
In the WLCSP and FLIPCHIP tests, the contact technology of solder balls accumulated by Test Socket for many years was applied to the production of probe cards. Reliable testing is achieved by using the unique advanced plating technology and alloy materials to prevent solder adhesion.
In order to ensure the reliability of various semiconductor RF components, high-frequency probes are indispensable.
1. For the purpose of high frequency testing, the full length is shortened to an ultimate length of 1.5 mm.
2. Depending on the type of component electrode, different needle types such as crown head and pointed head can be provided.
3. As with the general spring probe, you can replace any of the probes separately.
For the inspection of various magnetic sensors such as electronic compass, Hall IC, MR, and MI Sensor, it is sought to use a non-magnetic probe inspection.
With the Kelvin probe card of the traditional probe, the needle spacing of Force and Sense cannot be shortened, causing the tip of the needle to slip on the solder ball, and the tip of the needle is not in the center of the Pad, so stable contact cannot be obtained.
Compared with the current TCP and COF inspection probe cards, it is easier to respond to Multi DUT products, and each needle can be replaced individually to reduce operating costs.
A full range of probe series, the accumulated know-how of fixture manufacturing for many years, the product can meet the testing requirements of various electronic components. Therefore, any business that needs to use a probe for contact testing can contact us.
A variety of probes can be customized to meet customer needs.
No matter the length, the shape of the needle, the material of the material, the type of plating, the high frequency demand, the high temperature demand, the high current demand, etc., etc., if there are other needs, a review is also welcome.
