In order to ensure the reliability of various semiconductor RF components, high-frequency probes are indispensable.
Using our precision machining and assembly technology, we can produce probes that can respond to high-frequency tests and solve problems encountered by customers.
1. For the purpose of high frequency testing, the full length is shortened to an ultimate length of 1.5 mm.
2. Depending on the type of component electrode, different needle types such as crown head and pointed head can be provided.
3. As with the general spring probe, you can replace any of the probes separately.