Seiken Micro Technology Co.,Ltd.
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  • Spring Probe
    • Alloy Probe
    • High Frequency Probe
    • Fine Pitch Probe
    • Special Needs Probe
    • Probe For Customer Design
  • Probe Card
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    • Kelvin Probe Card
    • TCP/COF Vertical Type Probe Card
    • Micro Cube Probe Card
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    • IC TEST SOCKET
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    • Flat Panel Display Lighting Test
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    • Desk Type Manual Test Fixture
  • Fixture
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  1. Home
  2. Products
  3. Spring Probe
  4. High Frequency Probe
  5. High Frequency Probe

Products

  • Spring Probe
    • Alloy Probe
      • Alloy Probe
    • High Frequency Probe
      • High Frequency Probe
    • Fine Pitch Probe
      • Fine Pitch Probe
    • Special Needs Probe
      • Special Needs Probe
    • Probe For Customer Design
      • Probe for Customer Design
  • Probe Card
    • Pogo Pin Probe Card
      • Pogo Pin Probe Card
    • Kelvin Probe Card
      • kelvin Probe Card
    • TCP/COF Vertical Type Probe Card
      • TCP/COF Vertical Type Probe Cards
    • Micro Cube Probe Card
      • Micro Cube Probe Card
  • Test Socket
    • High Frequncy Test Socket
      • High Frequncy Test Socket
    • TCP/COF TEST SOCKET
      • TCP/COF Test Socket
    • IC TEST SOCKET
      • IC Test Socket
  • FPD Test
    • Flat Panel Display Lighting Test
      • Flat Panel Display Lighting Test
  • Machine
    • PCB/Substrate Test System
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
    • MCM Substrate Test System
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
    • Desk Type Manual Test Fixture
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
  • Fixture
    • Probe Pin Tower
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
    • MCM IC Substrate O/S Test Probe Card
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
    • TAB/COF/TBGA O/S Test Probe Card
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
  • Application
    • Semiconductor Test
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Flat Panel Display Cell Test
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • High Density Printed Circuit Test
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Test Pin Solution
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Electronics Components
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Customized Solution
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
  • High Frequency Probe

High Frequency Probe

In order to ensure the reliability of various semiconductor RF components, high-frequency probes are indispensable.
1. For the purpose of high frequency testing, the full length is shortened to an ultimate length of 1.5 mm.
  2. Depending on the type of component electrode, different needle types such as crown head and pointed head can be provided.
  3. As with the general spring probe, you can replace any of the probes separately.
Model : High Frequency Probe

  • Description

High Frequency Probe | Taiwan's most professional semiconductor leading brand - Seiken Micro Technology Co., Ltd.

For questions related to high frequency probes and semiconductor applications, please refer to the following services or contact us.

Service:Semiconductor Manufacturing, Semiconductor Manufacturing, Semiconductor Wholesale, Fixtures, Spring Probes, Vertical Probe Cards, Test Sockets, Panel Testing, Machine Equipment


In order to ensure the reliability of various semiconductor RF components, high-frequency probes are indispensable.

Using our precision machining and assembly technology, we can produce probes that can respond to high-frequency tests and solve problems encountered by customers.

1. For the purpose of high frequency testing, the full length is shortened to an ultimate length of 1.5 mm.

2. Depending on the type of component electrode, different needle types such as crown head and pointed head can be provided.

3. As with the general spring probe, you can replace any of the probes separately.



        

Seiken Micro Technology Co.,Ltd.

9F.-7, No. 888, Jingguo Rd., Taoyuan Dist., Taoyuan City 330, Taiwan (R.O.C.)

TEL:+886 3-346-6062

FAX:+886 3-346-6052

Email:info@seiken.com.tw

Fixture
  • Probe Pin Tower
    • MCM IC Substrate O/S Test Probe Card
      • TAB/COF/TBGA O/S Test Probe Card
        Probe Card
        • Pogo Pin Probe Card
          • Kelvin Probe Card
            • TCP/COF Vertical Type Probe Card
              • Micro Cube Probe Card
                Test Socket
                • High Frequncy Test Socket
                  • TCP/COF TEST SOCKET
                    • IC TEST SOCKET
                      FPD Test
                      • Flat Panel Display Lighting Test
                        Machine
                        • PCB/Substrate Test System
                          • MCM Substrate Test System
                            • Desk Type Manual Test Fixture
                              Semiconductor manufacturer
                              • Semiconductor Producers
                                • Semiconductor Maker
                                  • Semiconductor Wholesale
                                    • Semiconductor Production
                                      • Test Socket Manufacturer
                                        • Test Socket Wholesale
                                          • Test Socket Production
                                            • Probe Card Manufacturer
                                              • Probe Card Wholesale
                                                • Probe Card Production
                                                  • Probe Tower Manufacturer
                                                    • Probe Tower Wholesale
                                                      • Probe Tower Production
                                                        • Substrate Test System Manufacturer
                                                          • Substrate Test System Wholesale
                                                            • Substrate Test System Production
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