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  4. High Frequncy Test Socket
  5. High Frequncy Test Socket

Products

  • Spring Probe
    • Alloy Probe
      • Alloy Probe
    • High Frequency Probe
      • High Frequency Probe
    • Fine Pitch Probe
      • Fine Pitch Probe
    • Special Needs Probe
      • Special Needs Probe
    • Probe For Customer Design
      • Probe for Customer Design
  • Probe Card
    • Pogo Pin Probe Card
      • Pogo Pin Probe Card
    • Kelvin Probe Card
      • kelvin Probe Card
    • TCP/COF Vertical Type Probe Card
      • TCP/COF Vertical Type Probe Cards
    • Micro Cube Probe Card
      • Micro Cube Probe Card
  • Test Socket
    • High Frequncy Test Socket
      • High Frequncy Test Socket
    • TCP/COF TEST SOCKET
      • TCP/COF Test Socket
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      • IC Test Socket
  • FPD Test
    • Flat Panel Display Lighting Test
      • Flat Panel Display Lighting Test
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    • PCB/Substrate Test System
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
    • MCM Substrate Test System
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
    • Desk Type Manual Test Fixture
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
  • Fixture
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      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
    • MCM IC Substrate O/S Test Probe Card
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
    • TAB/COF/TBGA O/S Test Probe Card
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
  • Application
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      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Flat Panel Display Cell Test
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      • Flat Panel Display Lighting Test
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      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • High Density Printed Circuit Test
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      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Test Pin Solution
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Electronics Components
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      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
    • Customized Solution
      • IC Test Socket
      • Flat Panel Display Lighting Test
      • Pogo Pin Probe Card
      • High Frequency Probe
      • PCB/Substrate Test System, MCM Substrate Test System, Desktop Manual Test Fixture
      • Special Needs Probe
      • kelvin Probe Card
      • TCP/COF Vertical Type Probe Cards
      • High Frequncy Test Socket
      • TCP/COF Test Socket
      • POGO TOWER, MCM IC package substrate test probe fixture, TAB/COF/TBGA short circuit inspection fixture
      • Probe for Customer Design
      • Alloy Probe
      • Micro Cube Probe Card
      • Fine Pitch Probe
  • High Frequncy Test Socket

High Frequncy Test Socket

經由改變針頭形狀和表面處理,使得探針在LGA、BGA等封裝方式測試方面,有穩定信號傳輸及沒有限制探針配置的優點。
Model : high-frequncy-test-socket

  • Description

High Frequncy Test Socket | Taiwan's most professional semiconductor leading brand - Seiken Micro Technology Co., Ltd.

For questions related to high frequency test sockets and semiconductor applications, please refer to the following services or contact us.

Service:Semiconductor Manufacturing, Semiconductor Manufacturing, Semiconductor Wholesale, Fixtures, Spring Probes, Vertical Probe Cards, Test Sockets, Panel Testing, Machine Equipment


Applicable: high frequency components of various packaging methods such as CSP, QFN, QFP, LGA, etc.

Description:

By changing the shape of the needle and surface treatment, the probe has the advantages of stable signal transmission and no limitation of probe configuration in terms of LGA, BGA and other package method tests. However, when the bandwidth is more than a certain level, the test of the high-frequency component may also have serious drawbacks. Therefore, Seiko is able to maintain the appearance of the probe so that it is not easily deformed by the unique precision machining and assembly technology, and has achieved an ultra-short length of 1.5 mm probe that could not be achieved before. For the world, we maintain the possibility of testing the high-frequency components of the general probe type Test Socket application.

        

Seiken Micro Technology Co.,Ltd.

9F.-7, No. 888, Jingguo Rd., Taoyuan Dist., Taoyuan City 330, Taiwan (R.O.C.)

TEL:+886 3-346-6062

FAX:+886 3-346-6052

Email:info@seiken.com.tw

Fixture
  • Probe Pin Tower
    • MCM IC Substrate O/S Test Probe Card
      • TAB/COF/TBGA O/S Test Probe Card
        Probe Card
        • Pogo Pin Probe Card
          • Kelvin Probe Card
            • TCP/COF Vertical Type Probe Card
              • Micro Cube Probe Card
                Test Socket
                • High Frequncy Test Socket
                  • TCP/COF TEST SOCKET
                    • IC TEST SOCKET
                      FPD Test
                      • Flat Panel Display Lighting Test
                        Machine
                        • PCB/Substrate Test System
                          • MCM Substrate Test System
                            • Desk Type Manual Test Fixture
                              Semiconductor manufacturer
                              • Semiconductor Producers
                                • Semiconductor Maker
                                  • Semiconductor Wholesale
                                    • Semiconductor Production
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                                          • Test Socket Production
                                            • Probe Card Manufacturer
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                                                  • Probe Tower Manufacturer
                                                    • Probe Tower Wholesale
                                                      • Probe Tower Production
                                                        • Substrate Test System Manufacturer
                                                          • Substrate Test System Wholesale
                                                            • Substrate Test System Production
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